Plastic Deformation of InSb Micro-Pillars: A Comparative Study Between Spatially Resolved Laue and Monochromatic X-Ray Micro-Diffraction Maps

Plastic Deformation of InSb Micro-Pillars: A Comparative Study Between Spatially Resolved Laue and Monochromatic X-Ray Micro-Diffraction Maps

T. Sadat, M. Verezhak, P. Godard, P.O. Renault, S. Van Petegem, V. Jacques, A. Diaz, D. Grolimund, L. Thilly

Abstract. Indium Antimonide (InSb) single-crystalline micro-pillars were mechanically deformed by uniaxial compression loading-unloading cycles up to the beginning of the plastic regime. After deformation, 2D spatially resolved maps were collected via two X-Ray Diffraction (XRD) techniques: polychromatic micro-Laue and monochromatic micro-diffraction. In both techniques, the integrated diffracted intensity shows strong variations inside the pillar. Moreover, the shift and streaking of one spot in polychromatic XRD as well as the lattice strain and tilt components derived from monochromatic XRD reveal that the plastically deformed area is localized on the top of the pillar, in agreement with scanning electron microscopy images. The two XRD techniques are thus providing correlated but yet complementary information.

Keywords
Micro-Pillars, InSb, Laue Microdiffraction, Monochromatic Microdiffraction, Synchrotron Radiation, Plasticity

Published online 9/11/2018, 6 pages
Copyright © 2018 by the author(s)
Published under license by Materials Research Forum LLC., Millersville PA, USA

Citation: T. Sadat, M. Verezhak, P. Godard, P.O. Renault, S. Van Petegem, V. Jacques, A. Diaz, D. Grolimund, L. Thilly, ‘Plastic Deformation of InSb Micro-Pillars: A Comparative Study Between Spatially Resolved Laue and Monochromatic X-Ray Micro-Diffraction Maps’, Materials Research Proceedings, Vol. 6, pp 21-26, 2018

DOI: https://dx.doi.org/10.21741/9781945291890-4

The article was published as article 4 of the book Residual Stresses 2018

Content from this work may be used under the terms of the Creative Commons Attribution 3.0 licence. Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI.

References
[1] L. Thilly, R. Ghisleni, C. Swistak, J. Michler, In situ deformation of micro-objects as a tool to uncover the micro-mechanisms of the brittle-to-ductile transition in semiconductors: the case of indium antimonide, Philos. Mag. 92 (2012), 37-41. https://doi.org/10.1080/14786435.2012.704422
[2] J.M. Wheeler, L. Thilly, A. Morel, A.A. Taylor, A. Montagne, R. Ghisleni, J. Michler, The Plasticity of Indium Antimonide: Insights from Variable Temperature, Strain Rate Jump Micro-Compression Testing, Acta Materialia, 106 (2016), 283. https://doi.org/10.1016/j.actamat.2015.12.036
[3] V.L.R. Jacques, D. Carbone, R. Ghisleni, L. Thilly, Counting dislocations in microcrystals by coherent X-Ray diffraction, Phys. Rev. Lett. 111 (2013), 1-5. https://doi.org/10.1103/PhysRevLett.111.065503
[4] H. Van Swygenhoven, S. Van Petegem, The use of Laue Microdiffraction to study small-scale plasticity, JOM, 62(12), (2010), 36-43. https://doi.org/10.1007/s11837-010-0178-4
[5] X. Chen, C. Dejoie, T. Jiang, C.-S. Ku, N. Tamura, Quantitative microstructural imaging by scanning Laue x-ray micro- and nanodiffraction, MRS Bull., 41(6), (2016), 445-453. https://doi.org/10.1557/mrs.2016.97
[6] R. Spolenak, W. Ludwig, J. Y. Buffiere, J. Michler, In situ Elastic Strain Measurements-Diffraction and Spectroscopy, MRS Bull., 35 (5), (2010), 368-374. https://doi.org/10.1557/mrs2010.569
[7] A. Bhowmik, J. Lee, T.B. Britton, W. Liu, T.-S. Jun, G. Sernicola, M. Karimpour, D.S. Balint, F. Giuliani, Deformation behaviour of [001] oriented MgO using combined in-situ nano-indentation and micro-Laue diffraction, Acta Mater. 145 (2018), 516-531. https://doi.org/10.1016/j.actamat.2017.12.002