A.M. AL-QUDAH, M.S. MOUSA
Abstract. This paper analyses the relationship between the distribution of a dielectric layer on the apex of a metal field electron emitter and the distribution of electron emission. Emitters were prepared by coating a tungsten emitter with a layer of epoxylite resin (Clark Electromedical Instruments Epoxylite resin). A high-resolution scanning electron microscope was used to monitor the emitter profile and measure the coating thickness. Field electron microscope studies of the emission current distribution from these composite emitters have been carried out. The study found a correlation between the thickness distribution of the dielectric layer on the emitter apex and the distribution of electron emission. When the thickness distribution of the dielectric layer on the emitter apex is uniform and smooth, the distribution of electron emission takes the form of a bright single emission spot. When the thickness distribution of the dielectric layer is irregular, the electron emission image exhibits several emission spots.
Keywords
Electron Emission, Nano-Tip Apex, SEM Images, Dielectric Layer
Published online 12/10/2016, 3 pages
Copyright © 2016 by the author(s)
Published under license by Materials Research Forum LLC., Millersville PA, USA
Citation: A.M. AL-QUDAH, M.S. MOUSA, ‘Analysis of the relationship between the distribution of a dielectric layer on a nano-tip apex and the distribution of emitted electrons’, Materials Research Proceedings, Vol. 1, pp 183-185, 2016
DOI: https://dx.doi.org/10.21741/9781945291197-46
The article was published as article 46 of the book Dielectric Materials and Applications
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