Charge Density of Al Doped Lanthanum Orthoferrites
R. Saravanan, G. Gowri
Bulk Al doped lanthanum orthoferrites (La1-xAlxFeO3-LAFO) have been prepared using the solid state reaction method, for three different concentrations of Al (x=0, 0.40, 0.50). The prepared samples have been characterized by a powder X-ray diffractometer, scanning electron microscope, energy dispersive analysis using X-ray, UV-Visible spectrometer and vibration sample magnetometer respectively. The X- ray data of the samples have been used for resolving the structure and the refined structure factors were used for the study of the charge density distribution in the unit cell of the prepared samples, using the maximum entropy method. The magnetic behaviour of the Al doped samples has been found to enhance significantly as studied from the VSM measurements. Due to the enhancement in ferromagnetic behavior of aluminium doped lanthanum orthoferrite, the material can be considered as a capable candidate for magnetic memory device applications within the doping limit.
Keywords
XRD, MEM, Charge Density, VSM, UV-Visible Spectra
Published online 6/1/2016, 20 pages
DOI: 10.21741/9781945291036-9
Part of Novel Ceramic Materials
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