Electronic Bonding Analysis on Dilute Doping of Iron in Nickel Oxide Nano Crystals
K. S. Arjun, S. Saravanakumar, M. Prema Rani
The electronic bonding of Ni1-xFexO (x=0.00, 0.01, 0.02) nanocrystalline powders was analyzed using MEM (Maximum Entropy Method). All the samples were prepared using the chemical co-precipitation method. X-ray diffraction (XRD), UV absorption spectroscopy and Vibration Sample Magnetometer (VSM) measurements were performed to study the crystal structure, optical bang gap and magnetic properties of the prepared samples. The X-ray data were refined using the Rietveld refinement. Using one, two and three dimensional MEM maps, the bonding within the atoms was evaluated.
Keywords
X-Ray Diffraction, Rietveld Refinement, Band Gap, Maximum Entropy Method
Published online 6/1/2016, 12 pages
DOI: 10.21741/9781945291036-6
Part of Novel Ceramic Materials
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