Heterogeneous development of twinning characteristics in titanium subjected to directional bending

Heterogeneous development of twinning characteristics in titanium subjected to directional bending

Sujit Nayak, Somjeet Biswas

Abstract. The present study investigates the through-thickness heterogeneous twin evolution in a hot-rolled titanium (Ti) sheet subjected to 90° bending along the rolling (RD) and transverse (TD) direction at room temperature. The microstructure evolution of the bent sheets was investigated using a field-emission scanning electron microscope (FESEM) equipped with electron backscatter diffraction (EBSD). Significant variations in twin formation were observed in both the bend loading directions and in through-thickness regions. The TD bend sample showed a dominant {101 ̅2}〈101 ̅1〉 extension twins (ET) in the inner compressive region (ICR), with few {112 ̅2}〈112 ̅3 ̅ 〉 contraction twins (CT) in the outer tensile region (OTR). In contrast, the RD bend sample exhibited {101 ̅2} ET and {112 ̅2} CT in both the regions, but with a lower overall twin fraction than in the ICR of the TD bend sample. The present findings highlight the critical roles of bend-loading direction and regional stress states in governing heterogeneous twin evolution.

Keywords
Titanium, Bending, Anisotropy, Twinning

Published online 5/10/2026, 6 pages
Copyright © 2026 by the author(s)
Published under license by Materials Research Forum LLC., Millersville PA, USA

Citation: Sujit Nayak, Somjeet Biswas, Heterogeneous development of twinning characteristics in titanium subjected to directional bending, Materials Research Proceedings, Vol. 65, pp 80-85, 2026

DOI: https://doi.org/10.21741/9781644904138-12

The article was published as article 12 of the book Processing and Characterization of Materials

Content from this work may be used under the terms of the Creative Commons Attribution 3.0 license. Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI.

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